@article{zhang:hal-04356726,
TITLE = {EDDMF: An Efficient Deep Discrepancy Measuring Framework For Full-Reference Light Field Image Quality Assessment},
AUTHOR = {Zhang, Zhengyu and Tian, Shishun and Zou, Wenbin and Morin, Luce and Zhang, Lu},
URL = {https://hal.science/hal-04356726},
JOURNAL = {IEEE Transactions on Image Processing},
PUBLISHER = {Institute of Electrical and Electronics Engineers},
SERIES = {Ieee Transactions On Image Processing},
VOLUME = {32},
PAGES = {6426-6440},
YEAR = {2023},
DOI = {10.1109/tip.2023.3329663},
KEYWORDS = {Measurement ; Feature extraction ; Distortion measurement ; Data mining ; Quality assessment ; Image quality ; Distortion ; Light field ; image quality assessment ; full-reference ; patch ; deep-learning},
PDF = {https://hal.science/hal-04356726/file/Zhang%20et%20al-2023-EDDMF%20an%20efficient%20deep%20discrepancy%20measuring%20framework%20for%20full-reference%20light%20field%20image%20quality%20assessment.pdf},
HAL_ID = {hal-04356726},
HAL_VERSION = {v1},
}