@article{alrashid:hal-04334074,
TITLE = {Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study},
AUTHOR = {Al Rashid, Jaber and Koohestani, Mohsen and Saintis, Laurent and Barreau, Mihaela},
URL = {https://univ-angers.hal.science/hal-04334074},
JOURNAL = {IEEE Transactions on Device and Materials Reliability},
HAL_LOCAL_REFERENCE = {SFD},
PUBLISHER = {Institute of Electrical and Electronics Engineers},
VOLUME = {24},
NUMBER = {1},
PAGES = {2-13},
YEAR = {2024},
MONTH = Mar, DOI = {10.1109/TDMR.2023.3340426},
KEYWORDS = {Reliability ; Degradation ; Integrated circuit modeling ; Integrated circuits ; Stress ; Data models ; Immunity testing ; step-stress ADT ; DPI ; ALT ; physics based model ; Weibull distribution ; time-to-failure ; reliability function ; step-stress ADT DPI ALT physics based model Weibull distribution time-to-failure reliability function},
PDF = {https://univ-angers.hal.science/hal-04334074/file/IEEETransactionsonDeviceReliability_finalisedR.pdf},
HAL_ID = {hal-04334074},
HAL_VERSION = {v1},
}