@article{autran:hal-04333942,
TITLE = {Multi-scale, Multi-physics Modeling and Simulation of Single Event Effects in Digital Electronics: from Particles to Systems},
AUTHOR = {Autran, Jean-Luc and Munteanu, Daniela},
URL = {https://amu.hal.science/hal-04333942},
JOURNAL = {IEEE Transactions on Nuclear Science},
PUBLISHER = {Institute of Electrical and Electronics Engineers},
VOLUME = {71},
NUMBER = {1},
PAGES = {31-66},
YEAR = {2024},
MONTH = Jan, DOI = {10.1109/TNS.2023.3337288},
KEYWORDS = {circuit simulation ; compact models ; device modeling and simulation ; digital circuits ; digital single-event transient ; radiation effects ; single-event effects ; soft error rate ; transport models ; radiation transport codes},
PDF = {https://amu.hal.science/hal-04333942/file/TNS_Review_Autran_Munteanu_2023_HAL.pdf},
HAL_ID = {hal-04333942},
HAL_VERSION = {v1},
}