@inproceedings{plot:hal-04282540,
TITLE = {Smart Input Space Sampling Combined with Kriging-Partial Least Square Regression for EMC Risk Analysis at PCB Level with Many Variables},
AUTHOR = {Plot, A. and Besnier, P. and Goral, B.},
URL = {https://hal.science/hal-04282540},
BOOK
TITLE = {2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023},
ADDRESS = {Krakow, Poland},
PUBLISHER = {Institute of Electrical and Electronics Engineers Inc.},
SERIES = {IEEE International Symposium on Electromagnetic Compatibility},
VOLUME = {2023-September},
YEAR = {2023},
MONTH = Sep, DOI = {10.1109/EMCEurope57790.2023.10274313},
KEYWORDS = {Design rules ; EMC risk analysis ; K-PLS ; Kriging ; Morris analysis ; Partial least square ; Surrogate model},
HAL_ID = {hal-04282540},
HAL_VERSION = {v1},
}