@article{munteanu:hal-04265835,
TITLE = {Basic Mechanisms of Single-Event Occurrence in Silicon Carbide Semiconductor under Terrestrial Atmospheric Neutron Irradiation},
AUTHOR = {Munteanu, Daniela and Autran, Jean-Luc},
URL = {https://amu.hal.science/hal-04265835},
JOURNAL = {Electronics},
PUBLISHER = {MDPI},
VOLUME = {12},
NUMBER = {21},
PAGES = {4468},
YEAR = {2023},
DOI = {10.3390/electronics12214468},
KEYWORDS = {terrestrial cosmic rays ; atmospheric neutrons ; neutron--semiconductor interactions ; silicon carbide ; carbon-diamond ; nuclear reactions ; Geant4 ; numerical simulations ; radiation effects on electronics ; single-event effects},
PDF = {https://amu.hal.science/hal-04265835/file/electronics-12-04468-v2.pdf},
HAL_ID = {hal-04265835},
HAL_VERSION = {v1},
}