@inproceedings{alrashid:hal-04239269,
TITLE = {High Temperature Accelerated Ageing Influence on the Conducted Immunity Modelling of the Commonly Used Voltage Regulator ICs},
AUTHOR = {Al Rashid, Jaber and Koohestani, Mohsen and Saintis, Laurent and Barreau, M.},
URL = {https://univ-angers.hal.science/hal-04239269},
BOOK
TITLE = {2023 International Symposium on Electromagnetic Compatibility -- EMC Europe},
ADDRESS = {Cracovie, Poland},
HAL_LOCAL_REFERENCE = {SFD},
PUBLISHER = {IEEE},
SERIES = {2023 International Symposium on Electromagnetic Compatibility -- EMC Europe},
PAGES = {1-7},
YEAR = {2023},
MONTH = Sep, DOI = {10.1109/EMCEurope57790.2023.10274315},
KEYWORDS = {Thermal stress ; Accelerated degradation test ; Electromagnetic compatibility EMC modeling ; Electromagnetic compatibility of ICs ; Conducted immunity ; Power distribution network ; Internal behavior model},
PDF = {https://univ-angers.hal.science/hal-04239269/file/EMCEurope2023_Jaber_Al%20Rashid.pdf},
HAL_ID = {hal-04239269},
HAL_VERSION = {v1},
}