@article{khan:hal-04123013,
TITLE = {Validation of IC Conducted Emission and Immunity Models Including Aging and Thermal Stress},
AUTHOR = {Khan, Qazi Mashaal and Koohestani, Mohsen and Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard},
URL = {https://hal.science/hal-04123013},
JOURNAL = {IEEE Transactions on Electromagnetic Compatibility},
PUBLISHER = {Institute of Electrical and Electronics Engineers},
PAGES = {1-14},
YEAR = {2023},
MONTH = Mar, DOI = {10.1109/TEMC.2023.3253385},
KEYWORDS = {Integrated circuits ; Integrated circuit modeling ; Immunity testing ; Power supplies ; Pins ; Stress ; Life estimation},
PDF = {https://hal.science/hal-04123013/file/Khan%20et%20al-2023-Validation%20of%20IC%20Conducted%20Emission%20and%20Immunity%20Models%20Including%20Aging%20and.pdf},
HAL_ID = {hal-04123013},
HAL_VERSION = {v1},
}