@article{kuentz:hal-03932195,
TITLE = {Effect of electrically induced cracks on the properties of PZT thin film capacitors},
AUTHOR = {Kuentz, H. and Wague, B. and Vaxelaire, N. and Demange, V. and Poulain, C. and Guilloux-Viry, M. and Rhun, G Le},
URL = {https://hal.science/hal-03932195},
JOURNAL = {Applied Physics Letters},
PUBLISHER = {American Institute of Physics},
VOLUME = {121},
NUMBER = {23},
PAGES = {232901},
YEAR = {2022},
DOI = {10.1063/5.0127111},
KEYWORDS = {Ferroelectric films ; Ferroelectricity ; Piezoelectricity ; C-domain ; Domain structure ; Ferroelectric and piezoelectric properties ; Ferroelectric polarization ; Induced crack ; Layer thickness ; Piezoelectric coefficient ; Property ; Remnant polarizations ; Thin-film capacitors ; Polarization},
PDF = {https://hal.science/hal-03932195/file/Kuentz%20%202022%20Effect%20of%20electrically%20induced%20cracks%20APL-PZT_fissuration-HK-revised.pdf},
HAL_ID = {hal-03932195},
HAL_VERSION = {v1},
}