@article{alrashid:hal-03794416,
TITLE = {Coupling simulation and accelerated degradation model for reliability estimation: Application to a voltage regulator},
AUTHOR = {Al Rashid, Jaber and Saintis, Laurent and Koohestani, Mohsen and Barreau, Mihaela},
URL = {https://hal.science/hal-03794416},
JOURNAL = {Microelectronics Reliability},
HAL_LOCAL_REFERENCE = {SFD},
PUBLISHER = {Elsevier},
SERIES = {Microelectronics Reliability},
VOLUME = {138},
PAGES = {114682},
YEAR = {2022},
MONTH = Nov, DOI = {10.1016/j.microrel.2022.114682},
KEYWORDS = {Degradation path model ; Electrical simulation model ; Reliability performance estimation ; Lifetime data distribution ; Failure threshold ; Accelerated degradation},
PDF = {https://hal.science/hal-03794416/file/ESREf2022%20Microelectronics_Jaber%20%281%29.pdf},
HAL_ID = {hal-03794416},
HAL_VERSION = {v1},
}