@article{boukhenoufa:hal-03776577,
TITLE = {Two-dimensional numerical simulations of 1/f noise by GR mechanisms in thin film transistors: Effects of induced defect technology},
AUTHOR = {Boukhenoufa, A. and Pichon, L. and Cordier, C.},
URL = {https://hal.science/hal-03776577},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {47},
NUMBER = {9-11},
PAGES = {1419-1423},
YEAR = {2007},
MONTH = Sep, DOI = {10.1016/j.microrel.2007.07.059},
HAL_ID = {hal-03776577},
HAL_VERSION = {v1},
}