@article{pichon:hal-03776575,
TITLE = {Determination of interface state distribution in polysilicon thin film transistors from low-frequency noise measurements: Application to analysis of electrical properties},
AUTHOR = {Pichon, L. and Boukhenoufa, A. and Cordier, C. and Cretu, B.},
URL = {https://hal.science/hal-03776575},
JOURNAL = {Journal of Applied Physics},
PUBLISHER = {American Institute of Physics},
VOLUME = {100},
NUMBER = {5},
PAGES = {054504},
YEAR = {2006},
MONTH = Sep, DOI = {10.1063/1.2335395},
HAL_ID = {hal-03776575},
HAL_VERSION = {v1},
}