@article{zhang:hal-03690764,
TITLE = {Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors},
AUTHOR = {Zhang, Peng and Jacques, Emmanuel and Rogel, Regis and Pichon, Laurent and Bonnaud, Olivier},
URL = {https://hal.science/hal-03690764},
JOURNAL = {IEEE Transactions on Electron Devices},
PUBLISHER = {Institute of Electrical and Electronics Engineers},
VOLUME = {69},
NUMBER = {6},
PAGES = {3175-3180},
YEAR = {2022},
DOI = {10.1109/TED.2022.3167938},
KEYWORDS = {Access resistance ; density of states (DOS) ; intrinsic mobility ; polycrystalline silicon ; threshold voltage ; vertical thin-film transistors (TFTs) ; Access resistance},
PDF = {https://hal.science/hal-03690764/file/Zhang%20et%20al-2022-Elucidation%20of%20the%20Density%20of%20States%20for%20Polycrystalline%20Silicon%20Vertical.pdf},
HAL_ID = {hal-03690764},
HAL_VERSION = {v1},
}