@article{sehil:hal-03662128,
TITLE = {Characterization of the polysilicon thin film transistors elaborated in high and low temperature processes. Study of the density of traps},
AUTHOR = {Sehil, H. and Rahmani, N.M. and Pichon, L. and Menezla, R. and Raoult, F. and Benamara, Z.},
URL = {https://hal.science/hal-03662128},
JOURNAL = {Synthetic Metals},
PUBLISHER = {Elsevier},
VOLUME = {90},
NUMBER = {3},
PAGES = {181-185},
YEAR = {1997},
MONTH = Nov, DOI = {10.1016/S0379-6779(98)80004-0},
HAL_ID = {hal-03662128},
HAL_VERSION = {v1},
}