@article{khan:hal-03629861,
TITLE = {A Comparative Performance Analysis of 6T \& 9T SRAM Integrated Circuits: SOI vs. Bulk},
AUTHOR = {Khan, Qazi Mashaal and Perdriau, Richard and Ramdani, Mohamed and Koohestani, Mohsen},
URL = {https://hal.science/hal-03629861},
JOURNAL = {IEEE Letters on Electromagnetic Compatibility Practice and Applications},
PUBLISHER = {IEEE},
VOLUME = {4},
NUMBER = {2},
PAGES = {25-30},
YEAR = {2022},
MONTH = Apr, DOI = {10.1109/LEMCPA.2022.3163963},
KEYWORDS = {SRAM cells ; Transistors ; Thermal stability ; Circuit stability ; Measurement ; Leakage currents ; Electromagnetic compatibility ; SRAM SOI bulk SNM N-curve PT ; SRAM ; SOI ; bulk ; SNM ; N-curve ; PT},
PDF = {https://hal.science/hal-03629861/file/A_Comparative_Performance_Analysis_of_6T_9T_SRAM_Integrated_Circuits__SOI_vs__Bulk.pdf},
HAL_ID = {hal-03629861},
HAL_VERSION = {v1},
}