@inproceedings{mashaalkhan:hal-03412859,
TITLE = {A Comparative Study of On-Chip CMOS S\&H Voltage Sensors for Power Integrity: SOI vs. Bulk},
AUTHOR = {Mashaal Khan, Qazi and Perdriau, Richard and Ramdani, Mohamed and Koohestani, Mohsen},
URL = {https://hal.science/hal-03412859},
BOOK
TITLE = {2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium},
ADDRESS = {Raleigh, United States},
PUBLISHER = {IEEE},
PAGES = {911-916},
YEAR = {2021},
MONTH = Jul, DOI = {10.1109/EMC/SI/PI/EMCEurope52599.2021.9559242},
KEYWORDS = {Temperature sensors ; Voltage measurement ; Power demand ; Voltage fluctuations ; Sensitivity ; Silicon-on-insulator ; Sensors},
PDF = {https://hal.science/hal-03412859/file/EMC_Europe_2021_Qazi_updated.pdf},
HAL_ID = {hal-03412859},
HAL_VERSION = {v1},
}