@inproceedings{alrashid:hal-03361394,
TITLE = {A State-of-the-Art Review on IC EMC Reliability},
AUTHOR = {Al Rashid, Jaber and Koohestani, Mohsen and Saintis, Laurent and Barreau, Mihaela},
URL = {https://univ-angers.hal.science/hal-03361394},
BOOK
TITLE = {Proceedings of the 31st European Safety and Reliability Conference},
ADDRESS = {Angers, France},
HAL_LOCAL_REFERENCE = {SFD},
PUBLISHER = {Research Publishing Services},
PAGES = {1850-1857},
YEAR = {2021},
MONTH = Sep, DOI = {10.3850/978-981-18-2016-8\_154-cd},
KEYWORDS = {EMC ; electromagnetic robustness ; reliability ; integrated circuits ; conducted immunity and emission model ; EFT},
PDF = {https://univ-angers.hal.science/hal-03361394/file/154.pdf},
HAL_ID = {hal-03361394},
HAL_VERSION = {v1},
}