@article{elmourabit:hal-03134217,
TITLE = {Predictive System of Semiconductor Failures based on Machine Learning Approach},
AUTHOR = {El Mourabit, Yousef and El Habouz, Youssef and Zougagh, Hicham and Wadiai, Younes},
URL = {https://hal.science/hal-03134217},
JOURNAL = {International journal of advanced computer science and applications (IJACSA)},
PUBLISHER = {The Science and Information Organization},
VOLUME = {11},
NUMBER = {12},
PAGES = {199-203},
YEAR = {2020},
DOI = {10.14569/IJACSA.2020.0111225},
KEYWORDS = {Machine learning ; semiconductor ; predictive maintenance ; industry 4.0},
PDF = {https://hal.science/hal-03134217/file/Paper_25-Predictive_System_of_Semiconductor_Failures.pdf},
HAL_ID = {hal-03134217},
HAL_VERSION = {v1},
}