@inproceedings{larbi:hal-03103325,
TITLE = {Analysis of Parameter Variability in Integrated Devices by Partial Least Squares Regression},
AUTHOR = {Larbi, M. and Trinchero, R. and Canavero, F.G. and Besnier, Philippe and Swaminathan, M.},
URL = {https://hal.science/hal-03103325},
BOOK
TITLE = {24th IEEE Workshop On Signal and Power Integrity, SPI 2020},
ADDRESS = {Cologne, Germany},
PUBLISHER = {Institute of Electrical and Electronics Engineers Inc.},
SERIES = {SPI 2020 - 24th IEEE Workshop On Signal and Power Integrity, Proceedings},
PAGES = {9218175},
YEAR = {2020},
MONTH = May, DOI = {10.1109/SPI48784.2020.9218175},
KEYWORDS = {integrated voltage regulator (IVR) ; Machine learning ; PLS regression ; sensitivity analysis ; surrogate model ; uncertainty quantification},
HAL_ID = {hal-03103325},
HAL_VERSION = {v1},
}