@inproceedings{ginot:hal-02961338,
TITLE = {M{\'e}thode de mesure du courant de fuite de grille comme indicateur de vieillissement d{\'e}di{\'e}e aux Gate Drivers},
AUTHOR = {Ginot, Nicolas and Batard, Christophe and Weckbrodt, Julien and Long Le, Thanh and Azzopardi, St{\'e}phane},
URL = {https://hal.science/hal-02961338},
BOOK
TITLE = {Symposium de G{\'e}nie Electrique},
ADDRESS = {Nantes, France},
PAGES = {sciencesconf.org:sge2020:309362},
YEAR = {2021},
MONTH = Jul, KEYWORDS = {Gate Drivers ; fuite de grille ; SiC ; monitoring ; viellissement},
HAL_ID = {hal-02961338},
HAL_VERSION = {v1},
}