@article{zhang:hal-02891811,
TITLE = {Characterization and electrical modeling of polycrystalline silicon vertical thin film transistors},
AUTHOR = {Zhang, P and Jacques, Emmanuel and Rogel, R{\'e}gis and Pichon, Laurent and Bonnaud, Olivier},
URL = {https://hal.science/hal-02891811},
JOURNAL = {Solid-State Electronics},
PUBLISHER = {Elsevier},
VOLUME = {171},
PAGES = {107798},
YEAR = {2020},
MONTH = Sep, DOI = {10.1016/j.sse.2020.107798},
KEYWORDS = {Low temperature polycrystalline silicon ; Conduction modeling ; Vertical thin film transistors ; Density of states},
PDF = {https://hal.science/hal-02891811/file/Zhang%20et%20al-2020-Characterization%20and%20electrical%20modeling%20of%20polycrystalline%20silicon%20vertical.pdf},
HAL_ID = {hal-02891811},
HAL_VERSION = {v1},
}