@inproceedings{mashaalkhan:hal-02749814,
TITLE = {Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers},
AUTHOR = {Mashaal Khan, Qazi and Koohestani, Mohsen and Ramdani, Mohamed and Perdriau, Richard},
URL = {https://hal.science/hal-02749814},
BOOK
TITLE = {International Symposium on Electromagnetic Compatibility (EMC Europe 2020)},
ADDRESS = {Rome (virtual conference), Italy},
YEAR = {2020},
MONTH = Sep, DOI = {10.1109/EMCEUROPE48519.2020.9245783},
PDF = {https://hal.science/hal-02749814/file/Obsolescence-EMC-Khan.pdf},
HAL_ID = {hal-02749814},
HAL_VERSION = {v1},
}