@article{bonnot:hal-02094908,
TITLE = {Adaptive Simulation-based Framework for Error Characterization of Inexact Circuits},
AUTHOR = {Bonnot, Justine and Camus, Vincent and Desnos, Karol and Menard, Daniel},
URL = {https://hal.science/hal-02094908},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {96},
PAGES = {60-70},
YEAR = {2019},
MONTH = May, DOI = {10.1016/j.microrel.2019.02.007},
KEYWORDS = {inexact operators ; quality of service ; characterization ; error modelization ; Approximate computing ; inferential statistics ; extreme values ; inexact circuits},
PDF = {https://hal.science/hal-02094908/file/Adaptive%20Simulation-based%20Framework%20for%20Error%20Characterization%20of%20Inexact%20Circuits.pdf},
HAL_ID = {hal-02094908},
HAL_VERSION = {v1},
}