@article{koohestani:hal-01996029,
TITLE = {A Novel Passive Cost-Effective Technique to Improve Radiated Immunity on PCBs},
AUTHOR = {Koohestani, Mohsen and Perdriau, Richard and Levant, Jean-Luc and Ramdani, Mohamed},
URL = {https://hal.science/hal-01996029},
JOURNAL = {IEEE Transactions on Electromagnetic Compatibility},
PUBLISHER = {Institute of Electrical and Electronics Engineers},
VOLUME = {61},
NUMBER = {6},
PAGES = {1733-1739},
YEAR = {2019},
MONTH = Jan, DOI = {10.1109/TEMC.2018.2882732},
KEYWORDS = {Impedance ; Integrated circuits ; Dielectrics ; Immunity testing ; Loading ; Pins ; Magnetic susceptibility ; Index Terms-Dielectric loading ; far field ; integrated circuits (ICs) ; near field ; radiated immunity ; transverse electromagnetic (TEM) cell},
PDF = {https://hal.science/hal-01996029/file/Koohestani%20et%20al_2019_A%20Novel%20Passive%20Cost-Effective%20Technique%20to%20Improve%20Radiated%20Immunity%20on%20PCBs.pdf},
HAL_ID = {hal-01996029},
HAL_VERSION = {v1},
}