@article{hong:hal-01879714,
TITLE = {The Effect of Bake Temperature on SU-8 Gate Insulator of IGZO Thin Film Transistor},
AUTHOR = {Hong, Min-Taek and Moon, Seung Jae and Lee, Jong Mo and Bae, Byung Seong and Yun, Eui-Jung and Harnois, Maxime and Jacques, Emmanuel and Mohammed-Brahim, Tayeb},
URL = {https://univ-rennes.hal.science/hal-01879714},
JOURNAL = {Journal of the Korean Physical Society},
PUBLISHER = {Korean physical society},
VOLUME = {73},
NUMBER = {3},
PAGES = {297-301},
YEAR = {2018},
MONTH = Aug, DOI = {10.3938/jkps.73.297},
KEYWORDS = {Oxide semiconductor ; Oxide TFT ; Low voltage driving ; Insulator ; Oxidation response},
HAL_ID = {hal-01879714},
HAL_VERSION = {v1},
}