@inproceedings{toutah:hal-01649448,
TITLE = {State creation under gate bias stress in polysilicon TFT's studied from the temperature -- transfer characteristics behavior},
AUTHOR = {Toutah, H. and Llibre, Jean-Fran{\c c}ois and Tala-Ighil, Boubekeur and Boudart, Bertrand and Mohammed-Brahim, Tayeb},
URL = {https://hal.science/hal-01649448},
BOOK
TITLE = {European Materials Research Society},
ADDRESS = {Strasbourg, France},
YEAR = {2002},
HAL_ID = {hal-01649448},
HAL_VERSION = {v1},
}