@article{toutah:hal-01647861,
TITLE = {Degradation in polysilicon thin film transistors related to the quality of the polysilicon material},
AUTHOR = {Toutah, H. and Tala-Ighil, B. and Llibre, Jean-Fran{\c c}ois and Boudart, B. and Mohammed-Brahim, T. and Bonnaud, O.},
URL = {https://hal.science/hal-01647861},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {43},
NUMBER = {9-11},
PAGES = {1531 - 1535},
YEAR = {2003},
MONTH = Sep, DOI = {10.1016/S0026-2714(03)00271-3},
HAL_ID = {hal-01647861},
HAL_VERSION = {v1},
}