@article{park:hal-01131636,
TITLE = {Surface Roughness and Microwave Surface Scattering of High-Resolution Imaging Radar},
AUTHOR = {Park, Sang-Eun and Ferro-Famil, Laurent and Allain, Sophie and Pottier, Eric},
URL = {https://hal.science/hal-01131636},
JOURNAL = {IEEE Geoscience and Remote Sensing Letters},
PUBLISHER = {IEEE - Institute of Electrical and Electronics Engineers},
VOLUME = {12},
NUMBER = {4},
PAGES = {756 - 760},
YEAR = {2015},
MONTH = Apr, DOI = {10.1109/LGRS.2014.2361144},
KEYWORDS = {spatial resolution backscattering coefficient dependence ; spatial resolution effect ; surface backscattering characteristic ; surface backscattering traditional computation ; surface scattering model ; truncated surface roughness autocorrelation function ; Backscatter ; Radar imaging ; Rough surfaces ; Scattering ; Spatial resolution ; Imaging radar ; geophysical equipment ; radar polarimetry ; statistics ; surface roughness ; surface scattering ; approximate method ; closed-form expression ; high-resolution imaging radar microwave surface scattering ; high-resolution imaging radar surface roughness ; high-resolution radar backscattering signature underestimation ; infinite surface autocovariance function ; infinite surface roughness parameter ; polarimetric radar ; radar scattering response ; roughness second-order statistics},
HAL_ID = {hal-01131636},
HAL_VERSION = {v1},
}