@article{renoud:hal-01091491,
TITLE = {Monte Carlo simulation of the secondary electron yield of an insulating target bombarded by a defocused primary electron beam},
AUTHOR = {Renoud, R. and Mady, F. and Bigarr{\'e},
J. and Ganachaud, J.-P.},
URL = {https://hal.science/hal-01091491},
JOURNAL = {Journal of the European Ceramic Society},
PUBLISHER = {Elsevier},
VOLUME = {25},
NUMBER = {12},
PAGES = {2805--2808},
YEAR = {2005},
MONTH = Jan, DOI = {10.1016/j.jeurceramsoc.2005.03.144},
KEYWORDS = {Insulators ; Electron microscopy ; Charging effects ; Defects},
HAL_ID = {hal-01091491},
HAL_VERSION = {v1},
}