@inproceedings{toutah:hal-00958859,
TITLE = {State Creation under gate bias stress in polysilicon TFT's Studid from the temperature - Transfer charasterictic behavior},
AUTHOR = {Toutah, H. and Llibre, Jean-Fran{\c c}ois and Tala-Ighil, B. and Bouda, N. and Mohammed-Brahim, Tayeb},
URL = {https://hal.science/hal-00958859},
BOOK
TITLE = {E-MRS 2002},
ADDRESS = {Strasbourg, France},
YEAR = {2002},
MONTH = Jun, HAL_ID = {hal-00958859},
HAL_VERSION = {v1},
}