@inproceedings{bonnaud:hal-00936262,
TITLE = {Specific Tests of Thin Film Devices for Large Area Electronics},
AUTHOR = {Bonnaud, Olivier and Mohammed-Brahim, Tayeb},
URL = {https://hal.science/hal-00936262},
BOOK
TITLE = {Proc. of 3rd IEEE Latin-American Test Workshop},
ADDRESS = {Montevideo, Uruguay},
PAGES = {194-198},
YEAR = {2002},
MONTH = Feb, HAL_ID = {hal-00936262},
HAL_VERSION = {v1},
}