@article{queffelec:hal-00929884,
TITLE = {Intercomparison of Permittivity Measurement Techniques for Ferroelectric Thin Layers},
AUTHOR = {Queffelec, Patrick and Laur, Vincent and Chevalier, Alexis and Le Floch, Jean-Michel and Passerieux, Damien and Cros, Dominique and Madrangeas, Val{\'e}rie and Le Febvrier, Arnaud and D{\'e}putier, St{\'e}phanie and Guilloux-Viry, Maryline and Houzet, Gr{\'e}gory and Lacrevaz, Thierry and Bermond, C. and Fl{\'e}chet, B.},
URL = {https://hal.science/hal-00929884},
JOURNAL = {Journal of Applied Physics},
HAL_LOCAL_REFERENCE = {RFM},
PUBLISHER = {American Institute of Physics},
VOLUME = {115},
NUMBER = {2},
PAGES = {024103},
YEAR = {2014},
DOI = {10.1063/1.4858388},
KEYWORDS = {dielectric measurements ; thin films ; loss tangent ; Permittivity ; microwave measurements ; ferroelectric materials},
PDF = {https://hal.science/hal-00929884/file/JAP-Intercomparison%20of%20permittivity%20measurement%20techniques%20for%20ferroelectric%20thin%20layers-JAP.pdf},
HAL_ID = {hal-00929884},
HAL_VERSION = {v1},
}