@inproceedings{reytauriac:hal-00917929,
TITLE = {Reliatibility Oriented Process and Device Simulations of Power VDMOS transistors in Bipolar/CMOS/DMOS technology},
AUTHOR = {Rey-Tauriac, Y. and Taurin, M. and Lhermite, Herv{\'e} and Bonnaud, Olivier},
URL = {https://hal.science/hal-00917929},
BOOK
TITLE = {Proceedings of 10th IEEE IPFA Conference},
ADDRESS = {Singapour, Singapore},
PAGES = {29-35},
YEAR = {2003},
MONTH = Jul, HAL_ID = {hal-00917929},
HAL_VERSION = {v1},
}