@article{toutah:hal-00914213,
TITLE = {Degradation in polysilicon thin film transistors related to the quality of the polysilicon material},
AUTHOR = {Toutah, H. and Tala-Ighil, B. and Llibre, Jean-Fran{\c c}ois and Boudard, B. and Mohammed-Brahim, Tayeb and Bonnaud, Olivier},
URL = {https://hal.science/hal-00914213},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {43},
PAGES = {1531-1535},
YEAR = {2003},
MONTH = Sep, HAL_ID = {hal-00914213},
HAL_VERSION = {v1},
}