@article{toutah:hal-00913288,
TITLE = {Reliability of TFTs},
AUTHOR = {Toutah, H. and Llibre, Jean-Fran{\c c}ois and Mohammed-Brahim, Tayeb and Bonnaud, Olivier},
URL = {https://hal.science/hal-00913288},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {43},
PAGES = {1531-1535},
YEAR = {2003},
MONTH = Sep, HAL_ID = {hal-00913288},
HAL_VERSION = {v1},
}