@inproceedings{alaeldine:hal-00540904,
TITLE = {Predicting the Immunity of integrated circuits through Measurement Methods and Simulation Models},
AUTHOR = {Alaeldine, Ali and Cordi, J{\'e}r{\^o}me and Perdriau, Richard and Ramdani, Mohamed and Levant, Jean-Luc},
URL = {https://hal.science/hal-00540904},
BOOK
TITLE = {EMC Zurich},
ADDRESS = {Zurich, Switzerland},
PAGES = {79-82},
YEAR = {2007},
MONTH = Sep, HAL_ID = {hal-00540904},
HAL_VERSION = {v1},
}