@inproceedings{lafon:hal-00525280,
TITLE = {Immunity Modeling of Integrated Circuits : An Industrial Case},
AUTHOR = {Lafon, Fr{\'e}d{\'e}ric and de Daran, Fr{\'e}d{\'e}ric and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
URL = {https://hal.science/hal-00525280},
BOOK
TITLE = {7th International Workshop on Electromagnetic compatibility of Integrated circuits (EMC COMPO 09)},
ADDRESS = {Toulouse, France},
YEAR = {2009},
HAL_ID = {hal-00525280},
HAL_VERSION = {v1},
}