@article{pichon:hal-00437321,
TITLE = {Determination of interface state distribution in polysilicon thin film transistors from low frequency -noise measurements: application to analysis of electrical properties},
AUTHOR = {Pichon, Laurent and Boukhenoufa, Abdelmalek and Cordier, Christophe and Cretu, Bogdan},
URL = {https://hal.science/hal-00437321},
JOURNAL = {Journal of Applied Physics},
PUBLISHER = {American Institute of Physics},
VOLUME = {100},
NUMBER = {5},
PAGES = {54504-54509},
YEAR = {2006},
MONTH = Sep, HAL_ID = {hal-00437321},
HAL_VERSION = {v1},
}