@article{pichon:hal-00387394,
TITLE = {Improvement in the determination by 1/f noise measurements of the interface state distribution in polysilicon TFTs in relation with the compensation law of Meyer Neldel},
AUTHOR = {Pichon, Laurent and Boukhenoufa, Abdelmalek and Cretu, Bogdan and Rogel, Regis},
URL = {https://hal.science/hal-00387394},
JOURNAL = {Journal of Applied Physics},
PUBLISHER = {American Institute of Physics},
VOLUME = {105},
PAGES = {104503},
YEAR = {2009},
MONTH = May, DOI = {10.1063/1.3126706},
KEYWORDS = {Meyer Neldel law ; TFT ; 1/ noise ; Interface states distribution},
PDF = {https://hal.science/hal-00387394/file/JAP2009revisedtext.pdf},
HAL_ID = {hal-00387394},
HAL_VERSION = {v1},
}