@inproceedings{cordier:hal-00197402,
TITLE = {Two dimensional numerical simulation of 1/f noise by GR mechanisms in thin film transistors : Effects of induced defect technology},
AUTHOR = {Cordier, Christophe and Boukhenoufa, Abdelmalek and Pichon, Laurent},
URL = {https://hal.science/hal-00197402},
BOOK
TITLE = {Europeen Symposium Reliability on Electron Devices},
ADDRESS = {Arcachon, France},
YEAR = {2007},
HAL_ID = {hal-00197402},
HAL_VERSION = {v1},
}