@article{boukhenoufa:hal-00173652,
TITLE = {Two dimensional numerical simulations of 1/f noise by GR mechanisms in thin film transistors: Effects of induced defect technology},
AUTHOR = {Boukhenoufa, Abdelmalek and Pichon, Laurent and Cordier, Christophe},
URL = {https://hal.science/hal-00173652},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {47},
PAGES = {1419},
YEAR = {2007},
MONTH = Sep, DOI = {10.1016/j.microrel.2007.07.59},
PDF = {https://hal.science/hal-00173652/file/ESREF2007Publibis.pdf},
HAL_ID = {hal-00173652},
HAL_VERSION = {v1},
}