@article{carvou:hal-00085661,
TITLE = {Reliability improvement of high value doped polysilicon-based resistors},
AUTHOR = {Carvou, Erwann and Le Bihan, France and Sala{\"u}n, Anne-Claire and Rogel, R{\'e}gis and Bonnaud, Olivier and Rey-Tauriac, Y. and Gagnard, X. and Roland, L.},
URL = {https://hal.science/hal-00085661},
JOURNAL = {Microelectronics Reliability},
PUBLISHER = {Elsevier},
VOLUME = {42},
PAGES = {1369-1372},
YEAR = {2002},
HAL_ID = {hal-00085661},
HAL_VERSION = {v1},
}