@inproceedings{kuentz:cea-04539848,
TITLE = {Electrical induced cracking of PZT films and its effect on electrical properties of piezoelectric capacitors},
AUTHOR = {Kuentz, Hugo and Wague, Baba and Vaxelaire, Nicolas and Demange, Val{\'e}rie and Poulain, Christophe and Guilloux-Viry, Maryline and Le Rhun, Gwenael},
URL = {https://cea.hal.science/cea-04539848},
BOOK
TITLE = {ISAF 2022 - 2022 IEEE International Symposium on Applications of Ferroelectrics},
ADDRESS = {Tours, France},
YEAR = {2022},
MONTH = Jun, PDF = {https://cea.hal.science/cea-04539848/file/2022_IEEE-ISAF-conference_H-Kuentz%20-%20PZT%20cracking.pdf},
HAL_ID = {cea-04539848},
HAL_VERSION = {v1},
}